Packaging testing equipment
Product Detail
High-Resolution X-Ray Diffractometer
Model: X'Pert pro MRD
Manufacturer: Philips, Netherlands
Main Function: Used for comprehensive quality analysis of semiconductor epitaxial quantum well structures; quality analysis of crystalline film layers; single-layer metal film thickness analysis.
Technical Specifications: Six-dimensional precision goniometer, five testing modes:
Rocking Curve, Triple Axis, thin film phase, reflectivity testing, reciprocal space mapping.
