Packaging testing equipment
Product Detail
High-Performance Atomic Force Microscope
Model: Flex-Mount
Manufacturer: Nanosurf AG, Switzerland
Main Function: Capable of high-precision measurements of roughness, step height, and micro-nano level three-dimensional profiles, as well as measuring various advanced physical quantities such as phase, electric field, and magnetic field.
Technical Specifications: XY scanning range: maximum 100μm × 100μm, XY linearity <0.1%
Z scanning range: maximum 15μm
System height noise ≤25pm;
Sample size: ≤240mm × 240mm;
Sample thickness: ≤45mm
