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Packaging testing equipment
Tungsten Filament Scanning Electron Microscope
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Product Detail

Tungsten Filament Scanning Electron Microscope  

Model: EVO-10  
Manufacturer: Zeiss  
Main Function: Morphology analysis  
Technical Specifications: Resolution: secondary electron: 3nm (30kV); backscattered electron image: 4.5nm (30kV)
 
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