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Scanning Probe Microscope
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Product Detail

Scanning Probe Microscope  

Model: Veeco NanoScope MultiMode  
Manufacturer: Veeco, USA  
Main Function: Provides two-dimensional and three-dimensional morphology analysis characteristics for samples with fluctuations below 1 micron.  
Technical Specifications: Resolution: lateral 0.26nm, vertical 1nm (calibrated with mica crystal)  
Sample size: maximum diameter 12mm, thickness 8mm
 
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