Packaging testing equipment
Electrochemical Capacitance Voltage Profiling Instrument ECV
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Product Detail
Electrochemical Capacitance Voltage Profiling Instrument ECV
Model: dage WAFER PROFILER CVP 21
Manufacturer: Wep Technology, Germany
Main Function: Uses electrochemical etching method to test the depth-carrier concentration of semiconductor wafer materials
Technical Specifications: Mainly applicable to GaAs and InP series materials, etches GaN materials relatively slowly.
Optimal testing range: carrier concentration magnitude 10¹³ ~10²⁰/cm³
